Skip to main content

Noise effects in statistical subpixel pattern recognition

  • Image Processing
  • Conference paper
  • First Online:
  • 138 Accesses

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 719))

Abstract

Recognition of very low resolution patterns which cover only a few pixels in the image screen can not be made by the conventional recognition methods.

A theoretically new statistical pattern recognition method has been developed by the same author [1] for the recognition of patterns which are smaller than the size of the elementary pixel windows in the image. In this measurement the gray-level histogram of the objects examined is compared with the (calculated) gray-level densities of different possible objects, and the recognition is taken on the basis of the comparison. The examined pattern should be randomly distributed on the screen, or a random movement of camera (or target) is needed.

Now, effects of noise are analyzed and demonstrated through simulation and experiments, and noise models and noise reduction are suggested in the histogram domain.

This is a preview of subscription content, log in via an institution.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. T. Szirányi: ”Statistical subpixel pattern recognition by histograms,” in Proc. 11th IAPR International Conference on Pattern Recognition, The Hague, The Netherlands, IEEE-Proc., August 30, 1992, Vol.II, pp. 705–708

    Google Scholar 

  2. S.E. Reichenbach, S.K. Park, R. Narayanswamy: ”Characterizing digital image acquisition devices,” Optical Engineering, Vol.30, No.2, pp. 170–177, 1991

    Google Scholar 

  3. I.J. Cox, J.B. Kruskal, D.A. Wallach: ”Predicting and estimating the accuracy of a subpixel registration algorithm,” IEEE Trasns. Pattern Anal. Machine Intell, Vol.PAMI-12, No.8, pp. 721–734, 1990

    Google Scholar 

  4. T. Szirányi, L. Illés, T. Kovács: ”Procedure and arrangement to determine a beam-diameter,” Invention, Serial No.: 201403, Budapest, 1990

    Google Scholar 

  5. T. Szirányi: ”Statistical subpixel measurement technology of light-beam width and profiles,” Optics and Lasers in Engineering, Vol.16, No.1, pp. 1–15, 1992

    Google Scholar 

  6. I. Csiszár, J. Körner: ”Information Theory” Academic Press, Budapest, 1981

    Google Scholar 

  7. T. Szirányi, Á. Böröczky: ”Overall picture degradation error for scanned images and the efficiency of character recognition,” Optical Engineering, Vol.30, No.12, pp.1878–1885, 1991

    Google Scholar 

  8. L. Györfi, W. Hardle. P. Sarda, P. Vieu: ”Nonparametric Curve Estimation from time series (in Lecture Notes in Statistics, No. 60.),” Springer-Verlag, New York, 1989

    Google Scholar 

  9. S. Kullback, R.A. Leibler: ”On information and sufficiency,” Ann.Math.Statist, Vol.22, pp. 79–86, 1951

    Google Scholar 

  10. H. Shibata, I. Inoue, R. Miyagawa, H. Yamashita, N. Nohmi, A. Furukawa,, Y. Iida, T. Yamaguchi, Y. Endo, Y. Matsunaga, S. Manabe ”2M-pixel Vertically-Integrated HDTV Image sensor,” Abstract of International Solid-State Circuits Conference (39th ISSCC), February, 1992, San Francisco (IEEE), 1992

    Google Scholar 

  11. I. Kollár: ”Tools and Methods of Signal Analysis, in Technology of Electrical Measurements, ed. by L. Schnell,” John Wiley & Sons Ltd., London, 1992, pp.611–621

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Dmitry Chetverikov Walter G. Kropatsch

Rights and permissions

Reprints and permissions

Copyright information

© 1993 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Szirányi, T. (1993). Noise effects in statistical subpixel pattern recognition. In: Chetverikov, D., Kropatsch, W.G. (eds) Computer Analysis of Images and Patterns. CAIP 1993. Lecture Notes in Computer Science, vol 719. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-57233-3_9

Download citation

  • DOI: https://doi.org/10.1007/3-540-57233-3_9

  • Published:

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-57233-6

  • Online ISBN: 978-3-540-47980-2

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics