Abstract
This paper presents work aimed at rendering the dual-step EM algorithm of Cross and Hancock more efficient. The original algorithm integrates the processes of point-set alignment and correspondence. The consistency of the pattern of correspondence matches on the Delaunay triangulation of the points is used to gate contributions to the expected log-likelihood function for point-set alignment parameters. However, in its original form the algorithm uses a dictionary of structure-preserving mappings to asses the consistency of match. This proves to be a serious computational bottleneck. In this paper, we show how graph edit-distance can be used to compute the correspondence probabilities more efficiently. In a sensitivity analysis, we show that the edit distance method is not only more efficient, it is also more accurate than the dictionary-based method.
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© 2000 Springer-Verlag Berlin Heidelberg
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Bergamini, P., Cinque, L., Cross, A.D.J., Hancock, E.R., Levialdi, S., Myers, R. (2000). Efficient Alignment and Correspondence Using Edit Distance. In: Ferri, F.J., Iñesta, J.M., Amin, A., Pudil, P. (eds) Advances in Pattern Recognition. SSPR /SPR 2000. Lecture Notes in Computer Science, vol 1876. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-44522-6_26
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DOI: https://doi.org/10.1007/3-540-44522-6_26
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