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Automatic Mask Extraction for PIV-Based Dam-Break Analysis

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Pattern Recognition and Image Analysis (IbPRIA 2005)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 3523))

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Abstract

The analysis focus on dam breaks stems from their ability to offer a simplified, yet effective workbench for debris flow waves, which in turn are helpful in gaining a deeper understanding of the highly destructive debris flows. High-speed recordings of granular flows arising from a dam-break-like event can be processed to extract useful information about the flow dynamics.

Gradient-based optical-flow techniques cannot compute the correct velocity field as they detect the flow induced by the boundary evolution. Methods that are based on cross-correlation, such as particle imaging velocimetry (PIV), are able to capture the micro-scale flow, but, as they are designed for flows within fixed boundaries, they cannot deal directly with dam-break-caused flows because such flows, by their own nature, exhibit a fast moving boundary.

This paper presents a procedure that is able to compute the evolving background and supply it to a PIV program as a masking region that should be excluded from the computation of the flow velocity field. This improvement leads to reliable results, while reusing existing software.

All the resulting quantities are being used to tune a mathematical model describing the observed flows.

This work was partially granted by Italian Ministry of Instruction, University and Research under contract PRIN 2003.

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© 2005 Springer-Verlag Berlin Heidelberg

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Biancardi, A., Ghilardi, P., Pagliardi, M. (2005). Automatic Mask Extraction for PIV-Based Dam-Break Analysis. In: Marques, J.S., Pérez de la Blanca, N., Pina, P. (eds) Pattern Recognition and Image Analysis. IbPRIA 2005. Lecture Notes in Computer Science, vol 3523. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11492542_86

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  • DOI: https://doi.org/10.1007/11492542_86

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-26154-4

  • Online ISBN: 978-3-540-32238-2

  • eBook Packages: Computer ScienceComputer Science (R0)

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