Abstract
Frit glass bonding is a widely used technology for encapsulation of surface micro-machined structures like inertial sensors or gyroscopes on wafer level. Since for sensors in automotive applications, a lifetime of 15–20 years has to be guaranteed for, a reliable lifetime prediction is necessary. Different material parameters have to be known for a lifetime estimation based on stress corrosion cracking, which determines the long-term strength behaviour of most bonded interfaces of microsystems. Parameters needed for lifetime prediction have to describe the material’s resistance against crack propagation (fracture toughness K IC), the stress situation in a micro package and the long-term strength behaviour. Results for fracture toughness investigations presented in this paper were determined by the micro chevron test. The stress situation in a micro package was calculated by a thermo-mechanical Finite Element Analysis. Furthermore the residual stress in the glass layer and the linear thermal expansion coefficient were determined by a crack width measurement in an environmental scanning electron microscope.
Similar content being viewed by others
References
Bagdahn J (2000) Festigkeit und Lebensdauer direkt gebondeter Siliziumwafer unter mechanischer Belastung. PhD Theses, MLU Halle-Wittenberg
Bagdahn J et al. (2002) Influence of the frequency on fatigue of directly wafer-bonded silicon. Fatigue
Brown et al. (1992) Chevron-notch test experience, metals and non-metals. ASTM Philadelphia, ASTM PLN 04–011720–30
Choong Chong S et al. (2003) Effect of passivation on frit glass bonding method for wafer level hermetic sealing on MEMES devices. In: Proceedings of 5th EPTC 2003, 5th conference, pp 307–310
Ebert M, Bagdahn J (2004) Determination of residual stress in glass frit bonded MEMS by Finite Element Analysis. In: Proceedings of 5th EuroSimE, pp 407–412
Glien K et al. (2004) Strength and reliability properties of glass frit bonded micro packages. In: Proceedings of DTIP, Montreux, Switzerland, pp 119–124
Knechtel R (2004) Glass frit bonding—an universal technology for wafer level encapsulation and packaging. Proceedings of DTIP, Montreux, Switzerland, pp 77–82
Munz D et al. (1989) Mechanisches Verhalten Keramischer Werkstoffe. Springer, Berlin Heidelberg New York
Murakami Y (1990) Stress intensity factors handbook. Pergamon, Oxford
Petzold M (2001) Strength assessment of wafer-bonded micromechanical components using the micro chevron test, reliability, testing, and characterization of MEMS and MOEMS conference, San Francisco, USA, 22–24 October 2001
Petzold M et al. (2001) Strength assessment of wafer-bonded micromechanical components using the Micro-Chevron-Test’. Proceedings of the SPIE 4558, San Francisco, USA, pp 133–142
Acknowledgements
The author would like to thank the German Federal Ministry of Education and Research for financial support (contract 16SV1779) and Dr. Maik Wiemer from the Fraunhofer-Institute for Reliability and Microintegration Chemnitz (Germany) for fabrication of the test samples.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Dresbach, C., Krombholz, A., Ebert, M. et al. Mechanical properties of glass frit bonded micro packages. Microsyst Technol 12, 473–480 (2006). https://doi.org/10.1007/s00542-005-0031-9
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00542-005-0031-9